REVO® SFP2 base kit


Powered by 5-axis measurement technology, the SFP2’s automated surface finish inspection offers significant time savings, reduced part handling and greater return on CMM investment.

The SFP2 system consists of a probe and a range of modules and is automatically interchangeable with all other probe options available for REVO, providing the flexibility to easily select the optimum tool to inspect a wide range of features, all on one CMM platform. Data from multiple sensors is automatically referenced to a common datum.

The surface finish system is managed by the same I++ DME compliant interface as the REVO system, and full user functionality is provided by Renishaw’s MODUSTM metrology software.

SKU: A-5764-0005-KIT Categories: ,

Key benefits
Unrivalled feature access
SFP2 benefits from REVO’s infinite positioning and 5-axis movement, and features an integral motorized C axis. The SFM variants offer a range of tip arrangements which, combined with the knuckle joint between module and holder, provide access to the features most difficult to reach.

Operator independent data collection
CMM programs can now include automated and operator-independent surface finish measurement. All results, including surface finish data, are recorded and stored in a single location for easy retrieval.

Greater return on investment in CMMs
Integrated surface finish and dimensional inspection can remove the need for dedicated surface measurement equipment, reducing factory footprint, part handling and associated costs.

System features

Probe head REVO-2 only
Change rack MRS2 recommended for full capability
Software compatibility UCCsuite 5.2 onwards
MODUS 1.8 onwards
Weight SFP2 probe: 330 g
SFH1 holder: 33 g
SFM-A1 module: 12 g
SFM-A2 module: 12 g
Operating temperature range +10 ˚C to +40 ˚C
Storage temperature range -25 ˚C to +70 ˚C
Operating humidity 0% to 80% (non-condensing)
Calibration and verification artifacts SFA1: 3.0 μm Ra sinusoid
SFA2: 0.5 μm Ra sinusoid
SFA3: 0.4 μm Ra sawtooth
TFP: Uses LF TP20 module; PICS interface to SPA3 amplifier
Outputs MODUS basic: Ra, Rms(Rq)
MODUS standard surface texture: Rt, R3z, Rz, Rz1max, RzDIN, RzJIS, Rseg Rp, Rv Rpm, Rvm, Rc, Rsm
MODUS advanced surface texture: Rk, Rpk, Rvk, Rmr, Rmr1, Rmr2, Rpq, Rvq, Rmq, Rvoid, Rvdd, Rvddl, Rcvx, Rcvxl
Sampling rate 4 kHz

Additional information

Weight 6 lbs
Dimensions 20 × 12 × 6 in